E MCH 533
Scanned Image Microscopy (3) Imaging principles, quantitative data acquisition techniques, and applications for scanned image microscopy are discussed.
E MCH 533 Scanned Image Microscopy (3)
Scanned Image Microscopy comprises advanced techniques yielding new information in the form of highly resolved micro- and nano-scale images of surfaces and sub-surfaces of materials. The objectives of the course are (1) to endow students with a basic understanding of the principles behind scanned image microscopy, (2) to impart them skills to operate the high-resolution equipment, and (3) to train them to interpret the images obtained. Thus the course includes presentation of imaging principles (i.e. basic physics and design of instruments including the sensors), quantitative data acquisition techniques (including error analysis) and applications of scanned image microscopy. The course not only emphasizes scanning acoustic microscopy and ultrasonic atomic force microscopy, but it also includes environmental scanning electron microscopy and scanning laser confocal microscopy. These four microscopy techniques are too advanced to be routine and are intended for advanced characterization on the nano- andmicrometer scales.
Note : Class size, frequency of offering, and evaluation methods will vary by location and instructor. For these details check the specific course syllabus.