E SC 216
Characterization, Testing of Nanotechnology Structures and Materials (3) Measurements and techniques essential for controlling device fabrication.
E SC 216 Characterization, Testing of Nanotechnology Structures and Materials (3)
This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance. Characterization includes electrical, optical, physical, and chemical approaches. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), fluorescence microscopes, and fourier transform infrared spectroscopy.
Note : Class size, frequency of offering, and evaluation methods will vary by location and instructor. For these details check the specific course syllabus.